Equipment

Scanning and Local Probe Equipment / Instrumentation

Agilent AFM

Modes

  • Contact, tapping, lateral force, force spectroscopy, scanning Kelvin probe, MAC and Top MAC

Environmental control

  • Ambient, purged gas, fluid environments with heated and cooled stages

Applications: Controlled-environment AFM (fluid, purged gas, temperature- programmed). Polymers, electrochemistry, force spectroscopy. Magnetically-excited AFM.

Scan range

  • 90μm × 90 μm × 7 μm closed-loop scanner
  • 9 μm × 9 μm × 2 μm open loop scanner

Noise floor

  • <5 Å (large scanner)
  • <1 Å (small scanner)

Controller

  • Ten 16-bit channels input
  • Four 24-bit channels out

 

Go to Page

 

Asylum AFM

Modes available

  • Contact, AC (tapping) and Dual AC, 1-D forces, lateral force, nanolithography, Electrostatic Force, Kelvin probe, conductive AFM, Magnetic Force, piezoelectric force, thermal AFM

Applications

  • Stiffness and adhesion measurements, frictional force imaging. Nanolithography, electrostatic force microscopy, and scanning surface potential. Conductive AFM, magnetic and piezoresponse force microscopy.

Scan range

  • 90μm × 90μm × 15μm closed loop

Z noise

  • <0.06nm 0.1Hz-1kHz BW

Cantilever noise

  • <0.02nm Adev, 0.1Hz-1kHz BW.

Analog to Digital Converters

  • One 16-bit, 5 MHz channel

Digital to Analog Converters

  • Five 16-bit 100kHz channel

Direct Digital Synthesizer

  • Six 24-bit 100kHz channels, plus two 10-bit 10MHz summed on a single DAC
Go to Page

 

Bruker Icon AFM

AFM modes

  • PeakForce (with quantitative nanomechanics), tapping, contact, lateral force, magnetic force spectroscopy, Kelvin probe, conductive AFM, tunneling AFM, electrostatic force, magnetic force, piezoelectric force, torsional resonance mode.

Applications: Nano-mechanics, whole-wafer inspection, scanning conductivity/resistance microscopy. Thermal AFM. Electrical measurements of soft materials. Fluid tipholder.

X-Y scan range

  • 90μm × 90 μm × 10 μm

Vertical noise floor

  • <30 pm RMS

Current sensitivity

  • pA to μA

Motorized position stage (X-Y axis)

  • 180mm × 150mm
  • 210mm vacuum chuck
Go to Page

 

HV STM

Omicron STM-1 scanner

  • 2 μm x-y range
  • 20-50 pA min current

RHK SPM 1000 controller

  • 10 channel input
  • 26-bit resolution
  • complete signal access

Vacuum capability

  • 10-8 mtorr

Accessories

  • LEED, sample annealing, lock-in amplifiers, optical excitation

Applications: Atomically resolved imaging, density of states/bandgap analysis, photon-stimulated electrical properties, and nano-gap electrodes

Go to Page

 

Probe Station

Probe arms

  • 4 × 0-1GHz
  • 2 × 1-20 GHz

Vacuum

  • 10-6 torr

Lockin amplifiers

  • SRS 830, SRS 844

Impedance analyzer

  • Agilent E5061B 5Hz-3GHz

Network analyzer

  • Agilent N5230C 10MHz-20GHz

Temperature Range

  • LHe-100 °C

Electrometer

  • Kiethley 6517A

Function generators

  • SRS DS345 30MHz

Programming interface

  • Labview

Applications: Conductance, resistance, impedance, capacitance measurements of circuits, devices, and resonators.

Go to Page

Raman-NSOM

AFM scanners

  • 1μm, 10μm, and 100μm x-y range, 7μm z-range
  • 491, 532, and 660 nm laser sources

Optical heads

  • 0.7 NA 100× upright air lens
  • 1.3 NA 100× inverted oil immersion lens

Confocal Raman

  • Adjustable pinhole size and objective lens alignment

Spectrometer

  • 1800, 600, and 150/mm gratings and 75/mm Echele. Cooled CCD/EMCCD detector.

AFM modes

  • Contact, tapping, force mapping, Kelvin probe, conductive AFM, lateral force. Tuning fork AFM allows custom-cut and etched metal probes.

Environmental control

  • Enclosures for each scanner for gas purge. Heated sample stage, fluid cell.

Simultaneous AFM/Raman

  • Keeps samples of varying topography in focus

Near Field Scanning Optical Microscopy (NSOM)

  • AFM-aperture optical microscopy is available in transmission mode

Applications: Simultaneous chemical and topographic/mechanical analysis. In situ temperature measurement. AFM-aperture optical microscopy. Optical devices such as semiconductor lasers, waveguides, and plasmonic devices Investigation of cellular tissue, DNA, viruses and other biological objects. Nanotubes, nanowires, and quantum dots.

Go to Page

 

TIRF

Modes available

  • Contact, AC (tapping) and dual AC, 1-D forces, lateral force, nanolithography, electrostatic force, Kelvin probe, conductive AFM, magnetic force, piezoelectric force, thermal AFM

Applications: Mechanics of cells, tissues, and polymers. Tagging and identification of cells, proteins, and molecules. Controlled dosing of samples via micropipette. Controlled environment (fluid, temperature) experiments.

Scan range

  • 90μm × 90μm × 15 μm closed loop

Z noise

  • <0.06nm 0.1Hz-1kHz BW

Cantilever noise

  • <0.02nm Adev, 0.1Hz-1kHz BW

Accessories

  • Micromanipulator, nano-injector
  • Temperature-controlled chamber
  • Environmental fluid cell

Bio prep-space

  • CO2 incubator, Bio-safety cabinet

Optics

  • 641, 532, 488 nm lasers
  • Cascade II EMCCD camera with dual view filter
  • Nikon inverted optical microscope
  • 10×, 20×, 40×, 100× objectives

 

Go to Page

 

UHV VT AFM

Scan range

  • 10 μm x 10 μm x 1.5 μm

Z – resolution 0.01 nm

  • 01 nm

Tunneling current:

  • < 1pA – 330 nA

Gap voltage

  • ± 5 mV to ± 10 V; applied to tip/cantilever, sample grounded

Vacuum achievable:

  • 10-11 mbar or better

Sample size

  • 3mm x 9mm 7mm diameter

Temp range

  • 100K – 1500 K

Imaging modes

  • Contact, tapping, and FM noncontact

Accessories

  • LEED, Auger electron spectroscopy
  • Evaporator, leak valves for controlled gas environment, sputter gun

Controller

  • 20-bit, <25μV noise @ 60kHz up to 24 data acquisition signals

Applications: Atomically-resolved imaging of surfaces. Surface reconstruction. Friction and adhesion measurements. Surface potential and conductive AFM. Scanning Gate Microscopy. Scanning Kelvin Probe + Local dielectric AFM.

Go to Page