State-Of-The-Art Microscopes
The Nanoscale Characterization Facility (NCF) supports state-of-the-art tools for electron- and ion-beam analyses for Penn, as well as other university and industry users in the Philadelphia region. Our new facility comprises a suite of rooms specifically designed to host current and next-generation scanning electron, transmission electron and atomic force microscopes. The facility includes an integrated sample preparation laboratory with complete sample coating and plasma cleaning capabilities, as well as cryogenic TEM sample preparation equipment. A computer suite for offline image and data analysis and office and meeting space for staff and industrial users round out the facility in the Singh Center.
The NCF is currently maintained by three full-time experts with combined experience of over four decades in materials characterization. While serving the role as a university resource for materials characterization and nano-scale fabrication, we welcome users from other academic, corporate and government institutions.
Yates
Douglas Yates, Ph.D.
Director, Nanoscale Characterization Facility
Since 1997, Dr. Yates has been the director of the Nanoscale Characterization Facility, which houses instruments for advanced electron and atomic force microscopy and ion scattering. He has, cumulatively, twenty-seven years experience with the instruction, operation and maintenance of electron microscopes and related instruments.
Ford
Jamie Ford, Ph.D.
Staff Scientist, Nanoscale Characterization Facility
Jamie Ford received a BA in Chemistry from Reed College in 2002 and a PhD in Materials Science and Engineering from the University of Pennsylvania in 2009. His main duties include instrument maintenance and user training for the Scanning Electron and Atomic Force Microscopes in the NCF. He is also the lead developer of the Sigh Center’s Instrument Scheduling and Interlock System.
