Bruker Multimode AFM

Atomic force microscopy is conducted with a Digital Instruments Dimension 3000 and Multimode AFM’s. These are versatile AFM’s with capabilities ranging from atomic scale imaging to electro- and magnetic force imaging to fluid cell imaging. The Dimension 3000 AFM is located in the Quatrone Nanofabrication Facility, which allows for observing samples in an ultraclean environment and free the need for FAB users to leave the cleanroom to analyze their samples.

Capabilities include:

  • Contact mode
  • Tapping mode
  • Electro-force imaging
  • Magnetic force imaging
  • Fluid cell imaging